Critical area (computing)

In integrated circuit design, a critical area is a section of a circuit design wherein a particle of a particular size can cause a failure. It measures the sensitivity of the circuit to a reduction in yield.

The critical area $(A_c)$ on a single layer integrated circuit design is given by:
 * $$A_c =\int_{0}^{\infty} A(r)D(r)dr$$

where $$A(r)$$ is the area in which a defect of radius $$r$$ will cause a failure, and $$D(r)$$ is the density function of said defect.