Journal of Applied Remote Sensing

The Journal of Applied Remote Sensing is a peer-reviewed open access scientific journal published by SPIE. It covers all aspects of remote sensing and was established in 2007. The editor-in-chief is Ni-Bin Chang (University of Central Florida).

Abstracting and indexing
This journal is indexed by the following databases: According to the Journal Citation Reports, the journal has a 2020 impact factor of 1.53.
 * Science Citation Index Expanded
 * Current Contents/ Agriculture, Biology & Environmental Sciences
 * Current Contents/ Physical, Chemical & Earth Sciences
 * Inspec
 * Scopus
 * EI/Compendex
 * Astrophysics Data System