Talk:AFM probe

An editor requested speedy deletion as a very short article lacking sufficient context to identify the subject of the article. The article has grown, and is not in any sense very short. I will establish context. Fg2 (talk) 10:18, 14 July 2009 (UTC)

This stub was created as a suggestion to separate "AFM probe" - a physical consumable and measuring device - from "Atomic Force Microscopy" - a microscopy method. Gundawip 7 Sep 2011 —Preceding undated comment added 13:34, 7 September 2011 (UTC).

This article is very poor, it explains only one type of AFM sensor (the silicon micro-cantilever), it assumes the AFM is being used in contact mode. The article tries to explain AFM in a couple of sentences but makes generalizations based on one type of AFM, it also strays into the territory of MFM by discussing magnetic coated tips. I agree with User:Antony-22 that this should be merged with the main AFM page. This would allow the poor explanations of AFM to be removed, as detection methods and image formation are discussed elsewhere on that page. Also the section should be expanded to include other AFM sensors commonly in use, such as the qPlus sensor. StirlingJulian (talk) 19:40, 30 August 2013 (UTC)