User:Lcshaffertx/sandbox

Background
One contributor to the cost of producing Integrated circuits (IC's) is time required to test the device after it is fabricated and assembled. As Integrated Circuits evolve with higher complexity and greater functionality, Test Engineers are challenged to find creative and efficient ways to keep those times minimal. This article describes some techniques that might be used to minimize test time. While there are many types of automatic test equipment(ATE) today, the examples in this article were performed utilizing Teradyne's Flex test platform. The device examples in this article illustrating these techniques are mixed signal devices used in energy measurement and metering applications.