User:LouisaCatharina/Books/Intel Interview

Intel Interview

 * Devices
 * System on a chip
 * Central processing unit
 * Static random-access memory
 * Dynamic random-access memory
 * Flash memory
 * Flip-flop (electronics)
 * Logic gate
 * Digital electronics
 * Logic family
 * Truth table


 * Material Analysis
 * Atomic force microscopy
 * Scanning electron microscope
 * Transmission electron microscopy
 * Electron energy loss spectroscopy
 * Energy filtered transmission electron microscopy
 * High-resolution transmission electron microscopy
 * Scanning transmission electron microscopy
 * Focused ion beam


 * Fabrication
 * Reactive-ion etching
 * Chemical vapor deposition
 * Electron-beam lithography
 * High-κ dielectric
 * Low-k dielectric


 * Intel
 * Intel
 * Moore's law