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The optical Hall effect is the magnetic-field-induced deviation of the dielectric displacement across a macroscopic arrangement of polarizable matter at optical wavelengths, transverse and longitudinal to the incident electric field. Measurement of the optical Hall effect can be performed within the concept of generalized ellipsometry at an oblique angle of incidence. The magnetic-field-induced deviation of the dielectric displacement is analogous to the voltage difference (the Hall voltage) in the Hall effect. However, in the optical Hall effect, the displacement causes optical anisotropy in all three dimensions and which can be measured by varying the angle of incidence. As a result of anisotropy, in general, propagation of light, reflection, refraction and transmission, depends on direction of light propagation and state of light polarization. The anisotropy in the optical Hall effect depends on the magnitude and direction of the magnetic field, and the ability of a given arrangement of matter to produce such displacement. For certain cases such as the classic motion of a non-interacting volume density of free electrons in an ultra-thin sheet, the optical Hall effect is identical to the electrical Hall effect when measured at normal incidence and at infinite wavelength.

Model description

The electrical Hall effect and certain cases of the optical Hall effect observations can be explained by extensions of the classic Drude model for the transport of electrons in metals. The optical Hall effect is most useful for characterization of electrical properties in semiconductors.

Experimental configurations and advantages

The optical Hall effect dispenses with the need of electrical contacts in the electrical Hall effect. The optical Hall effect can determine effective mass and mobility parameters, including their anisotropy as well as charge carrier type and density simultaneously. Note that the electrical Hall effect cannot determine the effective mass parameter. Measurement of the optical Hall effect can be performed within the concept of generalized ellipsometry at an oblique angle of incidence. Measurement precision and accuracy can be increased by measuring the optical Hall effect at multiple angles of incidence.

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