User:Nano horse/Books/Material Analysis Instrument

Instrumentation

 * List of materials analysis methods


 * Morphology Characterization
 * Optical microscope
 * Near-field scanning optical microscope
 * Scanning electron microscope
 * Transmission electron microscopy
 * Atomic force microscopy
 * Scanning tunneling microscope
 * Focused ion beam


 * Material Composition
 * Energy-dispersive X-ray spectroscopy
 * X-ray photoelectron spectroscopy
 * Auger electron spectroscopy
 * Rutherford backscattering spectrometry
 * Secondary ion mass spectrometry


 * Material Structure
 * X-ray crystallography
 * Reflection high-energy electron diffraction
 * Low-energy electron diffraction