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Richard J. Lee, Ph.D., is a scientist, entrepreneur and Chief Executive Officer (CEO) of RJ Lee Group, Inc., a materials characterization laboratory and industrial forensics consulting firm headquartered in Monroeville, PA. Dr. Lee is recognized as a pioneer in materials characterization and analytical technology and methodology and as an expert witness.

Biography
Dr. Lee is a native of North Dakota. He received his undergraduate degree in Physics from the University of North Dakota in 1966 and his doctorate in Theoretical Solid State Physics from Colorado State University in 1970. Early on in his career he taught at Purdue University as both an Assistant Professor and Associate Professor and eventually joined the U.S. Steel Technical Center in Monroeville, PA where he remained for 12 years becoming the Head of the Physics, Electron Microscopy and Surface Analysis Section. In 1986, he helped form RJ Lee Group, Inc., where he pioneered the use of quantitative electron diffraction techniques and the automated sizing and chemical analysis of asbestos and other particles.

The Personal SEM (PSEM)
Dr. Lee conceived the idea for the first PC-based scanning electron microscope, assembled the development team and manufactured the finished product under the spin-off company, RJ Lee Group Instruments, LLC. Until this time, scanning electron microscopes (SEMs) required a large dedicated space and special facilities for installation, frequent maintenance and users with a certain level of knowledge. By combining the SEM, an x-ray analyzer (EDS) and intelligent software to create computer-controlled scanning electron microscopy (CCSEM), Dr. Lee introduced the first Personal SEM (PSEM). This wheeled, portable SEM with a small footprint was relatively inexpensive, required fewer facility requirements and less maintenance, and was easy to operate. Successful versions of the PSEM included applications for the analysis of gun shot residue and the analysis of inclusions as part of the process for monitoring steel production. The original version Personal SEM (PSEMTM-1), first generation integrated SEM/EDX system, was patented by Dr. Lee. In 1995, PSEM technology and manufacture was purchased by ASPEX Corporation.

Expert Witness
Dr. Lee has provided direction and technical oversight in more than a thousand cases, testified in deposition more than 100 times, and at trial more than 50 times. He was a principal investigator in various cases surrounding the WTC event, leading the physical and environmental damage assessments on behalf of Deutsche Bank whose building was damaged on 9/11. Some other notable cases involved the failure of more than 500,000 concrete railroad ties, the failure of synchronizers in heavy duty truck transmissions, the failure of knee implants, corrosion related to imported dry wall, and lead in imported toys.