User talk:Blair Bonnett/Archives/2010/March

Question about Van der Pauw method
Dear Sir,

My name is Jakub Pilaczyk from Technical University of Lodz (Poland), I attend in project of making hall mobility measurements on SiC. We use Van der Pauw method – especially described at site: http://www.eeel.nist.gov/812/meas.htm I am writing to ask you about significance of ohmic contacts at test specimen used in Van der Pauw method. I have read several papers about this test method. All sources denotes that it is necessary to measure specimen with ohmic contacts, but no one tells why? We obtain in our laboratory specimens where I-V characteristic is not plain, it has curvature. Could you give us a clue how serious error we will get using this specimens and maybe you could indicate equation, some dependances which cause this error arise. I am looking forward to hearing from you. If you could - please write at my e-mail box: kubapilarczyk@gmail.com

Yours faithfully, Jakub Pilarczyk —Preceding unsigned comment added by 217.113.225.86 (talk) 12:47, 7 March 2010 (UTC)