Talk:Electron tomography

"This technique has recently been used to directly visualize the atomic structure of screw dislocations in nanoparticles. [5]" This paper by Miao group has used the notorious Fourier filtering which might have introduced the artifacts to the reconstruction. It is entirely possible that the screw dislocation showed in the paper was an artefact than anything real. It is necessary to leave this ref. out before the dispute is over. — Preceding unsigned comment added by 131.243.15.162 (talk) 18:13, 25 July 2013 (UTC)[reply]

Why is HRTEM a better acronym than HR-TEM?

(i) Convention. (ii) High-resolution TEM, i.e. avoiding double hyphen. Materialscientist (talk) 00:34, 10 July 2010 (UTC)[reply]

How to reference to a paper without duplication? Now 6 and 7 are the same. —Preceding unsigned comment added by 128.84.211.27 (talk) 00:17, 14 July 2010 (UTC)[reply]

Electron Tomography is not restricted to TEM, you get SEM versions too.139.143.5.160 (talk) 14:23, 8 February 2013 (UTC)Kenny[reply]

Perhaps a separate page should be created for FIB/SEM tomography? Given the large differences in methodology and theoretical background, I think that would be a good idea. --EPadgett (talk) 02:53, 16 March 2016 (UTC)[reply]

Biological and materials science applications[edit]

Right now the introduction of this article is highly focused on biological applications, while the body of the article is focused almost entirely on ADF STEM, which is mostly used for materials applications. I think the article needs a better balance in this respect, and to separate out the general aspects that apply to both. I can work on balancing the introduction, but I don't know too much about biological applications. Are these mostly covered in the Cryo-electron tomography page? How does that page relate to this one? --EPadgett (talk) 20:38, 16 March 2016 (UTC)[reply]