List of materials analysis methods

This is a list of analysis methods used in materials science. Analysis methods are listed by their acronym, if one exists.

Symbols

 * μSR – see muon spin spectroscopy
 * χ – see magnetic susceptibility

A

 * AAS – Atomic absorption spectroscopy
 * AED – Auger electron diffraction
 * AES – Auger electron spectroscopy
 * AFM – Atomic force microscopy
 * AFS – Atomic fluorescence spectroscopy
 * Analytical ultracentrifugation
 * APFIM – Atom probe field ion microscopy
 * APS – Appearance potential spectroscopy
 * ARPES – Angle resolved photoemission spectroscopy
 * ARUPS – Angle resolved ultraviolet photoemission spectroscopy
 * ATR – Attenuated total reflectance

B

 * BET – BET surface area measurement (BET from Brunauer, Emmett, Teller)
 * BiFC – Bimolecular fluorescence complementation
 * BKD – Backscatter Kikuchi diffraction, see EBSD
 * BRET – Bioluminescence resonance energy transfer
 * BSED – Back scattered electron diffraction, see EBSD

C

 * CAICISS – Coaxial impact collision ion scattering spectroscopy
 * CARS – Coherent anti-Stokes Raman spectroscopy
 * CBED – Convergent beam electron diffraction
 * CCM – Charge collection microscopy
 * CDI – Coherent diffraction imaging
 * CE – Capillary electrophoresis
 * CET – Cryo-electron tomography
 * CL – Cathodoluminescence
 * CLSM – Confocal laser scanning microscopy
 * COSY – Correlation spectroscopy
 * Cryo-EM – Cryo-electron microscopy
 * Cryo-SEM – Cryo-scanning electron microscopy
 * CV – Cyclic voltammetry

D

 * DE(T)A – Dielectric thermal analysis
 * dHvA – De Haas–van Alphen effect
 * DIC – Differential interference contrast microscopy
 * Dielectric spectroscopy
 * DLS – Dynamic light scattering
 * DLTS – Deep-level transient spectroscopy
 * DMA – Dynamic mechanical analysis
 * DPI – Dual polarisation interferometry
 * DRS – Diffuse reflection spectroscopy
 * DSC – Differential scanning calorimetry
 * DTA – Differential thermal analysis
 * DVS – Dynamic vapour sorption

E

 * EBIC – Electron beam induced current (see IBIC: ion beam induced charge)
 * EBS – Elastic (non-Rutherford) backscattering spectrometry (see RBS)
 * EBSD – Electron backscatter diffraction
 * ECOSY – Exclusive correlation spectroscopy
 * ECT – Electrical capacitance tomography
 * EDAX – Energy-dispersive analysis of x-rays
 * EDMR – Electrically detected magnetic resonance, see ESR or EPR
 * EDS or EDX – Energy dispersive X-ray spectroscopy
 * EELS – Electron energy loss spectroscopy
 * EFTEM – Energy filtered transmission electron microscopy
 * EID – Electron induced desorption
 * EIT and ERT – Electrical impedance tomography and electrical resistivity tomography
 * EL – Electroluminescence
 * Electron crystallography
 * ELS – Electrophoretic light scattering
 * ENDOR – Electron nuclear double resonance, see ESR or EPR
 * EPMA – Electron probe microanalysis
 * EPR – Electron paramagnetic resonance spectroscopy
 * ERD or ERDA – Elastic recoil detection or elastic recoil detection analysis
 * ESCA – Electron spectroscopy for chemical analysis see XPS
 * ESD – Electron stimulated desorption
 * ESEM – Environmental scanning electron microscopy
 * ESI-MS or ES-MS – Electrospray ionization mass spectrometry or electrospray mass spectrometry
 * ESR – Electron spin resonance spectroscopy
 * ESTM – Electrochemical scanning tunneling microscopy
 * EXAFS – Extended X-ray absorption fine structure
 * EXSY – Exchange spectroscopy

F

 * FCS – Fluorescence correlation spectroscopy
 * FCCS – Fluorescence cross-correlation spectroscopy
 * FEM – Field emission microscopy
 * FIB – Focused ion beam microscopy
 * FIM-AP – Field ion microscopy–atom probe
 * Flow birefringence
 * Fluorescence anisotropy
 * FLIM – Fluorescence lifetime imaging
 * Fluorescence microscopy
 * FOSPM – Feature-oriented scanning probe microscopy
 * FRET – Fluorescence resonance energy transfer
 * FRS – Forward Recoil Spectrometry, a synonym of ERD
 * FTICR or FT-MS – Fourier-transform ion cyclotron resonance or Fourier-transform mass spectrometry
 * FTIR – Fourier-transform infrared spectroscopy

G

 * GC-MS – Gas chromatography-mass spectrometry
 * GDMS – Glow discharge mass spectrometry
 * GDOS – Glow discharge optical spectroscopy
 * GISAXS – Grazing incidence small angle X-ray scattering
 * GIXD – Grazing incidence X-ray diffraction
 * GIXR – Grazing incidence X-ray reflectivity
 * GLC – Gas-liquid chromatography

H

 * HAADF – High angle annular dark-field imaging
 * HAS – Helium atom scattering
 * HPLC – High performance liquid chromatography
 * HREELS – High resolution electron energy loss spectroscopy
 * HREM – High-resolution electron microscopy
 * HRTEM – High-resolution transmission electron microscopy
 * HI-ERDA – Heavy-ion elastic recoil detection analysis
 * HE-PIXE – High-energy proton induced X-ray emission

I

 * IAES – Ion induced Auger electron spectroscopy
 * IBA – Ion beam analysis
 * IBIC – Ion beam induced charge microscopy
 * ICP-AES – Inductively coupled plasma atomic emission spectroscopy
 * ICP-MS – Inductively coupled plasma mass spectrometry
 * Immunofluorescence
 * ICR – Ion cyclotron resonance
 * IETS – Inelastic electron tunneling spectroscopy
 * IGA – Intelligent gravimetric analysis
 * IGF – Inert gas fusion
 * IIX – Ion induced X-ray analysis, see particle induced X-ray emission
 * INS – Ion neutralization spectroscopy
 * Inelastic neutron scattering
 * IRNDT – Infrared non-destructive testing of materials
 * IRS – Infrared spectroscopy
 * ISS – Ion scattering spectroscopy
 * ITC – Isothermal titration calorimetry
 * IVEM – Intermediate voltage electron microscopy

L

 * LALLS – Low-angle laser light scattering
 * LC-MS – Liquid chromatography-mass spectrometry
 * LEED – Low-energy electron diffraction
 * LEEM – Low-energy electron microscopy
 * LEIS – Low-energy ion scattering
 * LIBS – Laser induced breakdown spectroscopy
 * LOES – Laser optical emission spectroscopy
 * LS – Light (Raman) scattering

M

 * MALDI – Matrix-assisted laser desorption/ionization
 * MBE – Molecular beam epitaxy
 * MEIS – Medium energy ion scattering
 * MFM – Magnetic force microscopy
 * MIT – Magnetic induction tomography
 * MPM – Multiphoton fluorescence microscopy
 * MRFM – Magnetic resonance force microscopy
 * MRI – Magnetic resonance imaging
 * MS – Mass spectrometry
 * MS/MS – Tandem mass spectrometry
 * MSGE – Mechanically stimulated gas emission
 * Mössbauer spectroscopy
 * MTA – Microthermal analysis

N

 * NAA – Neutron activation analysis
 * ND – Neutron diffraction
 * NDP – Neutron depth profiling
 * NEXAFS – Near edge X-ray absorption fine structure
 * NIS – Nuclear inelastic scattering/absorption
 * NMR – Nuclear magnetic resonance spectroscopy
 * NOESY – Nuclear Overhauser effect spectroscopy
 * NRA – Nuclear reaction analysis
 * NSOM – Near-field optical microscopy

O

 * OBIC – Optical beam induced current
 * ODNMR – Optically detected magnetic resonance, see ESR or EPR
 * OES – Optical emission spectroscopy
 * Osmometry

P

 * PAS – Positron annihilation spectroscopy
 * Photoacoustic spectroscopy
 * PAT or PACT – Photoacoustic tomography or photoacoustic computed tomography
 * PAX – Photoemission of adsorbed xenon
 * PC or PCS – Photocurrent spectroscopy
 * Phase contrast microscopy
 * PhD – Photoelectron diffraction
 * PD – Photodesorption
 * PDEIS – Potentiodynamic electrochemical impedance spectroscopy
 * PDS – Photothermal deflection spectroscopy
 * PED – Photoelectron diffraction
 * PEELS – parallel electron energy loss spectroscopy
 * PEEM – Photoemission electron microscopy (or photoelectron emission microscopy)
 * PES – Photoelectron spectroscopy
 * PINEM – photon-induced near-field electron microscopy
 * PIGE – Particle (or proton) induced gamma-ray spectroscopy, see nuclear reaction analysis
 * PIXE – Particle (or proton) induced X-ray spectroscopy
 * PL – Photoluminescence
 * Porosimetry
 * Powder diffraction
 * PTMS – Photothermal microspectroscopy
 * PTS – Photothermal spectroscopy

Q

 * QENS – Quasielastic neutron scattering
 * QCM-D – Quartz crystal microbalance with dissipation monitoring

R

 * Raman spectroscopy
 * RAXRS – Resonant anomalous X-ray scattering
 * RBS – Rutherford backscattering spectrometry
 * REM – Reflection electron microscopy
 * RDS – Reflectance difference spectroscopy
 * RHEED – Reflection high energy electron diffraction
 * RIMS – Resonance ionization mass spectrometry
 * RIXS – Resonant inelastic X-ray scattering
 * RR spectroscopy – Resonance Raman spectroscopy

S

 * SAD – Selected area diffraction
 * SAED – Selected area electron diffraction
 * SAM – Scanning Auger microscopy
 * SANS – Small angle neutron scattering
 * SAXS – Small angle X-ray scattering
 * SCANIIR – Surface composition by analysis of neutral species and ion-impact radiation
 * SCEM – Scanning confocal electron microscopy
 * SE – Spectroscopic ellipsometry
 * SEC – Size exclusion chromatography
 * SEIRA – Surface enhanced infrared absorption spectroscopy
 * SEM – Scanning electron microscopy
 * SERS – Surface enhanced Raman spectroscopy
 * SERRS – Surface enhanced resonance Raman spectroscopy
 * SESANS – Spin Echo Small Angle Neutron Scattering
 * SEXAFS – Surface extended X-ray absorption fine structure
 * SICM – Scanning ion-conductance microscopy
 * SIL – Solid immersion lens
 * SIM – Solid immersion mirror
 * SIMS – Secondary ion mass spectrometry
 * SNMS – Sputtered neutral species mass spectrometry
 * SNOM – Scanning near-field optical microscopy
 * SPECT – Single-photon emission computed tomography
 * SPM – Scanning probe microscopy
 * SRM-CE/MS – Selected-reaction-monitoring capillary-electrophoresis mass-spectrometry
 * SSNMR – Solid-state nuclear magnetic resonance
 * Stark spectroscopy
 * STED – Stimulated emission depletion microscopy
 * STEM – Scanning transmission electron microscopy
 * STM – Scanning tunneling microscopy
 * STS – Scanning tunneling spectroscopy
 * SXRD – Surface X-ray diffraction

T

 * TAT or TACT – Thermoacoustic tomography or thermoacoustic computed tomography (see also photoacoustic tomography – PAT)
 * TEM – Transmission electron microscopy
 * TGA – Thermogravimetric analysis
 * TIKA – Transmitting ion kinetic analysis
 * TIMS – Thermal ionization mass spectrometry
 * TIRFM – Total internal reflection fluorescence microscopy
 * TLS – Photothermal lens spectroscopy, a type of photothermal spectroscopy
 * TMA – Thermomechanical analysis
 * TOF-MS – Time-of-flight mass spectrometry
 * Two-photon excitation microscopy
 * TXRF – Total reflection X-ray fluorescence analysis

U

 * Ultrasound attenuation spectroscopy
 * UPS – UV-photoelectron spectroscopy
 * USANS – Ultra small-angle neutron scattering
 * USAXS – Ultra small-angle X-ray scattering
 * UT – Ultrasonic testing
 * UV-Vis – Ultraviolet–visible spectroscopy

V

 * VEDIC – Video-enhanced differential interference contrast microscopy
 * Voltammetry

W

 * WAXS – Wide angle X-ray scattering
 * WDX or WDS – Wavelength dispersive X-ray spectroscopy

X

 * XAES – X-ray induced Auger electron spectroscopy
 * XANES – XANES, synonymous with NEXAFS (near edge X-ray absorption fine structure)
 * XAS – X-ray absorption spectroscopy
 * X-CTR – X-ray crystal truncation rod scattering
 * X-ray crystallography
 * XDS – X-ray diffuse scattering
 * XPEEM – X-ray photoelectron emission microscopy
 * XPS – X-ray photoelectron spectroscopy
 * XRD – X-ray diffraction
 * XRES – X-ray resonant exchange scattering
 * XRF – X-ray fluorescence analysis
 * XRR – X-ray reflectivity
 * XRS – X-ray Raman scattering
 * XSW – X-ray standing wave technique