Teodor Gotszalk

Teodor Paweł Gotszalk is a Polish scientist who is head of Department of Nanometrology at Wrocław University of Science and Technology. Corresponding member of Polish Academy of Sciences since 2022. Teodor Gotszalk works in the area of nanotechnology and nanometrology, particularly scanning probe microscopy (SPM), scanning electron microscopy (SEM) and focused ion beam (FIB) techniques, and using microelectromechanical systems (MEMS).

Career
Teodor Gotszalk has been a Head of Department of Nanometrology at the Wrocław University of Science and Technology's Faculty of Microsystem Electronics and Photonics since 2006. Since then, he has been chairing the first Polish team focused on comprehensive metrology of micro- and nanostructures. The studies combine scanning probe microscopy, scanning electron microscopy and focused ion beam (SPM, SEM and FIB) techniques together with measurements of electrical, thermal, diffractive and optical properties of the structures.

Teodor Gotszalk has been a Corresponding member of the Polish Academy of Sciences since 2022.

Grants and awards
Awardee of the German Academic Exchange Service (DAAD) (30 months), Fulbright Program (4 months at the University at Albany, SUNY's College of Nanoscience and Engineering in 2010) and Kosciuszko Foundation (3 months at the University of California, Berkeley, 2022).